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fei helios nanolab 650 dualbeam scanning electron microscope-focused ion beam (sem-fib) system Fei Helios Nanolab 650 Dualbeam Scanning Electron Microscope Focused Ion Beam (Sem Fib) System, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/result/fei helios nanolab 650 dualbeam scanning electron microscope-focused ion beam (sem-fib) system/product/NanoLab Inc Average 90 stars, based on 1 article reviews
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